Electronic components must be tested before aging. Without aging testing, many semiconductor products will have many problems in use due to the complexity of devices and manufacturing processes. Aging test is to let the semiconductor overload work so that defects appear in a short time, to avoid early failure in use. Han de Bao motor has several main methods for aging test of stepper motor driver.
1. Driver performance testing: mainly concentrated in the driver efficiency, harmonic analysis, three-phase unbalance analysis, interference analysis and other testing items.
2. Driver response test: mainly through the motor test bench, to apply different loads to the motor, to observe whether the motor driver can quickly adjust the working state of the motor according to the algorithm when the load changes, to evaluate the performance of the driver response.
3, drive aging test: the main test drive anti-aging ability.